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hwmon: (emc2305) fix device node refcount leak in error path

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The for_each_child_of_node() macro automatically manages device node
reference counts during normal iteration. However, when breaking out
of the loop early with return, the current iteration's node is not
automatically released, leading to a reference count leak.

Fix this by adding of_node_put(child) before returning from the loop
when emc2305_set_single_tz() fails.

This issue could lead to memory leaks over multiple probe cycles.

Signed-off-by: Pei Xiao <xiaopei01@kylinos.cn>
Link: https://lore.kernel.org/r/tencent_5CDC08544C901D5ECA270573D5AEE3117108@qq.com
Signed-off-by: Guenter Roeck <linux@roeck-us.net>
This commit is contained in:
Pei Xiao
2025-12-05 11:15:13 +08:00
committed by Guenter Roeck
parent 541dfb49dc
commit 4910da6b36
1 changed files with 3 additions and 1 deletions
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4
drivers/hwmon/emc2305.c
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@@ -683,8 +683,10 @@ static int emc2305_probe(struct i2c_client *client)
i = 0;
for_each_child_of_node(dev->of_node, child) {
ret = emc2305_set_single_tz(dev, child, i);
if (ret != 0)
if (ret != 0) {
of_node_put(child);
return ret;
}
i++;
}
} else {